Principal component analysis for three-dimensional structured illumination microscopy (PCA-3DSIM)
Abstract Three-dimensional structured illumination microscopy (3DSIM) is an essential super-resolution imaging technique for visualizing volumetric subcellular structures at the nanoscale, capable of doubling both lateral and axial resolution beyond the diffraction limit. However, high-quality 3DSIM...
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| Principais autores: | , , , , , |
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| 格式: | Artigo |
| 語言: | Inglês |
| 出版: |
Nature Publishing Group
2025-09-01
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| 叢編: | Light: Science & Applications |
| 在線閱讀: | https://doi.org/10.1038/s41377-025-01979-8 |
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