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Prediction of Winter Wheat Maturity Dates through Assimilating Remotely Sensed Leaf Area Index into Crop Growth Model

Predicting crop maturity dates is important for improving crop harvest planning and grain quality. The prediction of crop maturity dates by assimilating remote sensing information into crop growth model has not been fully explored. In this study, a data assimilation framework incorporating the leaf...

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Principais autores: Wen Zhuo, Jianxi Huang, Xinran Gao, Hongyuan Ma, Hai Huang, Wei Su, Jihua Meng, Ying Li, Huailiang Chen, Dongqin Yin
פורמט: Artigo
שפה:Inglês
יצא לאור: MDPI AG 2020-09-01
סדרה:Remote Sensing
נושאים:
maturity prediction
maturity dates
WOFOST
LAI
data assimilation
גישה מקוונת:https://www.mdpi.com/2072-4292/12/18/2896
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