A Study on Length Traceability and Diffraction Efficiency of Chromium Gratings
Measurement traceability is a prerequisite for achieving accurate and reliable results as well as technical standardization. The period of Chromium (Cr) gratings fabricated by atomic lithography can be directly traced back to natural constants. Applying the Cr grating to grating interferometry can a...
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| Autores principales: | , , , , , , , , |
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| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
MDPI AG
2024-03-01
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| Colección: | Photonics |
| Materias: | |
| Acceso en línea: | https://www.mdpi.com/2304-6732/11/3/233 |
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