Parameterized Modeling and Calibration for Orbital Error in TanDEM-X Bistatic SAR Interferometry over Complex Terrain Areas

The TerraSAR-X add-on for Digital Elevation Measurements (TanDEM-X) bistatic system provides high-resolution and high-quality interferometric data for global topographic measurement. Since the twin TanDEM-X satellites fly in a close helix formation, they can acquire approximately simultaneous synthe...

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Auteurs principaux:	Huiqiang Wang, Yushan Zhou, Haiqiang Fu, Jianjun Zhu, Yanan Yu, Ruiping Li, Shengwei Zhang, Zhongyi Qu, Shouzhong Hu
Format:	Artigo
Langue:	Inglês
Publié:	MDPI AG 2021-12-01
Collection:	Remote Sensing
Sujets:	TanDEM-X interferometry InSAR orbital error correction digital elevation model (DEM) complex terrain
Accès en ligne:	https://www.mdpi.com/2072-4292/13/24/5124
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