Integrated Reliability Assessment and Optimal Reconfiguration of Islanded Microgrids Under Load Growth Using Fick’s Law Optimization Algorithm and Long Short-Term Memory Technique

This paper proposes an integrated framework for reliability assessment, load growth evaluation, and optimal reconfiguration of islanded microgrids under increasing electricity demand. The studied microgrid consists of solar photovoltaic (PV) panels, wind turbines, and diesel generators, operating in...

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מידע ביבליוגרפי

Principais autores:	Hieu M. Pham, Duy C. Huynh, Loc D. Ho, Matthew W. Dunnigan, Corina Barbalata
פורמט:	Artigo
שפה:	Inglês
יצא לאור:	IEEE 2025-01-01
סדרה:	IEEE Access
נושאים:	Fick’s law optimization algorithm long short-term memory technique load forecasting microgrid reconfiguration reliability assessment
גישה מקוונת:	https://ieeexplore.ieee.org/document/11114944/
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