Integrating 2D layered materials with 3D bulk materials as van der Waals heterostructures for photodetections: Current status and perspectives

Abstract In the last decade, two‐dimensional layered materials (2DLMs) have been drawing extensive attentions due to their unique properties, such as absence of surface dangling bonds, thickness‐dependent bandgap, high absorption coefficient, large specific surface area, and so on. But the high‐qual...

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Principais autores:	Weijie Liu, Yiye Yu, Meng Peng, Zhihua Zheng, Pengcheng Jian, Yang Wang, Yuanchen Zou, Yongming Zhao, Fang Wang, Feng Wu, Changqing Chen, Jiangnan Dai, Peng Wang, Weida Hu
פורמט:	Artigo
שפה:	Inglês
יצא לאור:	Wiley 2023-10-01
סדרה:	InfoMat
נושאים:	photodetectors three‐dimensional semiconductors two‐dimensional layered materials van der Waals heterostructures
גישה מקוונת:	https://doi.org/10.1002/inf2.12470
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