Detection of Electrical Circuit in a Thin-Film-Transistor Liquid-Crystal Display Using a Hybrid Optoelectronic Apparatus: An Array Tester and Automatic Optical Inspection

In this study, we developed a high-resolution, more accurate, non-destructive apparatus for refining the detection of electrode pixels in a thin-film-transistor liquid-crystal display (TFT-LCD). The hybrid optoelectronic apparatus simultaneously uses an array tester linked with the automatic optical...

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Autors principals:	Fu-Ming Tzu, Jung-Shun Chen, Shih-Hsien Hsu
Format:	Artigo
Idioma:	Inglês
Publicat:	MDPI AG 2021-08-01
Col·lecció:	Micromachines
Matèries:	array tester optical inspection time delay integration charge-coupled device (TDI-CCD) thin-film-transistor liquid-crystal display (TFT-LCD) optoelectronic apparatus
Accés en línia:	https://www.mdpi.com/2072-666X/12/8/964
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