Spectrum Analysis Enabled Periodic Feature Reconstruction Based Automatic Defect Detection System for Electroluminescence Images of Photovoltaic Modules

Electroluminescence (EL) imaging is a widely adopted method in quality assurance of the photovoltaic (PV) manufacturing industry. With the growing demand for high-quality PV products, automatic inspection methods based on machine vision have become an emerging area concern to replace manual inspecto...

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Principais autores:	Jiachuan Yu, Yuan Yang, Hui Zhang, Han Sun, Zhisheng Zhang, Zhijie Xia, Jianxiong Zhu, Min Dai, Haiying Wen
Formato:	Artigo
Idioma:	Inglês
Publicado em:	MDPI AG 2022-02-01
Colecção:	Micromachines
Assuntos:	defect detection computer vision spectrum analysis photovoltaic module electroluminescence image
Acesso em linha:	https://www.mdpi.com/2072-666X/13/2/332
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