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Whole Metagenomic-Assembled Genome (MAG) Resource for Xylella fastidiosa subsp. multiplex GaT2 Causing Pecan Bacterial Leaf Scorch in Georgia, United States

Xylella fastidiosa (Xf) is an endophytic bacterial pathogen that causes bacterial leaf scorch in pecan (Carya illinoinensis). DNA was isolated from a symptomatic pecan tree (cultivar Byrd) in Albany, Georgia. High-throughput sequencing (Illumina PE150) was performed. Assembly was performed and refer...

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Autors principals: Angelyn E. Hilton, Clive H. Bock, Tim Brenneman, Warren Chatwin, Jennifer Randall, Jianchi Chen
Format: Artigo
Idioma:Inglês
Publicat: The American Phytopathological Society 2025-09-01
Col·lecció:PhytoFrontiers
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Accés en línia:https://apsjournals.apsnet.org/doi/10.1094/PHYTOFR-09-24-0103-A
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