Whole Metagenomic-Assembled Genome (MAG) Resource for Xylella fastidiosa subsp. multiplex GaT2 Causing Pecan Bacterial Leaf Scorch in Georgia, United States
Xylella fastidiosa (Xf) is an endophytic bacterial pathogen that causes bacterial leaf scorch in pecan (Carya illinoinensis). DNA was isolated from a symptomatic pecan tree (cultivar Byrd) in Albany, Georgia. High-throughput sequencing (Illumina PE150) was performed. Assembly was performed and refer...
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| Autors principals: | , , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
The American Phytopathological Society
2025-09-01
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| Col·lecció: | PhytoFrontiers |
| Matèries: | |
| Accés en línia: | https://apsjournals.apsnet.org/doi/10.1094/PHYTOFR-09-24-0103-A |
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