Research on Total Internal Reflection Detection Technology for Subsurface Defects of Optical Elements Based on Spectral Confocal Principles

During the manufacturing of precision optical elements, subsurface defects seriously affect the performance of the elements, leading to the enhancement of light fields, an increase in laser absorption and an decrease in mechanical properties. It has become a key technology to realize the high-precis...

ver descrição completa

Detalhes bibliográficos

Principais autores:	Rongcai Bao, Kaige Qu, Lu Wu, Shijian Zhang, Anyu Sun
Formato:	Artigo
Idioma:	Inglês
Publicado em:	MDPI AG 2025-06-01
Colecção:	Sensors
Assuntos:	subsurface defect nondestructive testing spectral confocal total internal reflection
Acesso em linha:	https://www.mdpi.com/1424-8220/25/13/3969
Tags:	Adicionar Tag Sem tags, seja o primeiro a adicionar uma tag!