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Classification of a 3D Film Pattern Image Using the Optimal Height of the Histogram for Quality Inspection

A 3D film pattern image was recently developed for marketing purposes, and an inspection method is needed to evaluate the quality of the pattern for mass production. However, due to its recent development, there are limited methods to inspect the 3D film pattern. The good pattern in the 3D film has...

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Hlavní autoři: Jaeeun Lee, Hongseok Choi, Kyeongmin Yum, Jungwon Park, Jongnam Kim
Médium: Artigo
Jazyk:Inglês
Vydáno: MDPI AG 2023-08-01
Edice:Journal of Imaging
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On-line přístup:https://www.mdpi.com/2313-433X/9/8/156
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