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Anti-Blooming Clocking for Time-Delay Integration CCDs

This paper presents an investigation of the responsivity of a time-delay integration (TDI) charge-coupled device that employs anti-blooming clocking and uses a varying number of TDI stages. The influence of charge blooming caused by unused TDI stages in a TDI deployed selection scheme is shown exper...

Ausführliche Beschreibung

Gespeichert in:
Hauptverfasser: Denis Szymon Piechaczek, Olaf Schrey, Manuel Ligges, Bedrich Hosticka, Rainer Kokozinski
Format: Artigo
Sprache:Inglês
Veröffentlicht: MDPI AG 2022-10-01
Schriftenreihe:Sensors
Schlagworte:
time delay integration
charge-coupled device
responsivity
photon transfer curve
conversion gain
signal-to-noise ratio
Online-Zugang:https://www.mdpi.com/1424-8220/22/19/7520
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