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Van der Waals interfaces in multilayer junctions for ultraviolet photodetection

Abstract Developments in semiconductor science have led to the miniaturization and improvement of light detection technologies for many applications. However, traditional pn-junctions or three-dimensional device geometries for detection of ultraviolet (UV) light are still limited by the physical pro...

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Principais autores: Shihong Xie, Mustaqeem Shiffa, Mujahid Shiffa, Zakhar R. Kudrynskyi, Oleg Makarovskiy, Zakhar D. Kovalyuk, Wenkai Zhu, Kaiyou Wang, Amalia Patanè
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Portfolio 2022-09-01
Colecção:npj 2D Materials and Applications
Acesso em linha:https://doi.org/10.1038/s41699-022-00338-0
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