Tsang’s resolution enhancement method for imaging with focused illumination
Abstract A widely tested approach to overcoming the diffraction limit in microscopy without disturbing the sample relies on substituting widefield sample illumination with a structured light beam. This gives rise to confocal, image scanning, and structured illumination microscopy methods. On the oth...
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| Autors principals: | , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Nature Publishing Group
2025-04-01
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| Col·lecció: | Light: Science & Applications |
| Accés en línia: | https://doi.org/10.1038/s41377-025-01791-4 |
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