High-resolution detection of quantitative trait loci for seven important yield-related traits in wheat (Triticum aestivum L.) using a high-density SLAF-seq genetic map

Abstract Background Yield-related traits including thousand grain weight (TGW), grain number per spike (GNS), grain width (GW), grain length (GL), plant height (PH), spike length (SL), and spikelet number per spike (SNS) are greatly associated with grain yield of wheat (Triticum aestivum L.). To det...

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Автори:	Tao Li, Qiao Li, Jinhui Wang, Zhao Yang, Yanyan Tang, Yan Su, Juanyu Zhang, Xvebing Qiu, Xi Pu, Zhifen Pan, Haili Zhang, Junjun Liang, Zehou Liu, Jun Li, Wuyun Yan, Maoqun Yu, Hai Long, Yuming Wei, Guangbing Deng
Формат:	Artigo
Мова:	Inglês
Опубліковано:	BMC 2022-05-01
Серія:	BMC Genomic Data
Предмети:	Wheat Yield Yield-related traits Specific-locus amplified fragment (SLAF) Linkage analysis
Онлайн доступ:	https://doi.org/10.1186/s12863-022-01050-0
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