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X-Ray Single-Grating Interferometry for Wavefront Measurement and Correction of Hard X-Ray Nanofocusing Mirrors

X-ray single-grating interferometry was applied to conduct accurate wavefront corrections for hard X-ray nanofocusing mirrors. Systematic errors in the interferometer, originating from a grating, a detector, and alignment errors of the components, were carefully examined. Based on the measured wavef...

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Principais autores: Jumpei Yamada, Takato Inoue, Nami Nakamura, Takashi Kameshima, Kazuto Yamauchi, Satoshi Matsuyama, Makina Yabashi
Format: Artigo
Sprog:Inglês
Udgivet: MDPI AG 2020-12-01
Serier:Sensors
Fag:
X-ray mirror
X-ray nanofocusing
wavefront correction
grating interferometer
Online adgang:https://www.mdpi.com/1424-8220/20/24/7356
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