Defect Texts Mining of Secondary Device in Smart Substation with GloVe and Attention-Based Bidirectional LSTM

In the process of the operation and maintenance of secondary devices in smart substation, a wealth of defect texts containing the state information of the equipment is generated. Aiming to overcome the low efficiency and low accuracy problems of artificial power text classification and mining, combi...

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書誌詳細

主要な著者:	Kai Chen, Rabea Jamil Mahfoud, Yonghui Sun, Dongliang Nan, Kaike Wang, Hassan Haes Alhelou, Pierluigi Siano
フォーマット:	Artigo
言語:	Inglês
出版事項:	MDPI AG 2020-09-01
シリーズ:	Energies
主題:	secondary device defect classification GloVe attention mechanism text mining
オンライン･アクセス:	https://www.mdpi.com/1996-1073/13/17/4522
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