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Prototype of Wire Scanner System for Beam Profile Measurement for Free Electron Laser

Beam profile measurement via wire scanner is a semi-invasive method, which has advantage of less beam influence compared with a profile target, and is widely used in particle accelerator all over the world. Wire scanner is adopted to be applied to Shanghai High Repetition Rate X-ray Free Electron La...

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Bibliografske podrobnosti
Glavni avtor: WAN Jun;LENG Yongbin;YU Luyang;CHEN Jie;GAO bo;CHEN Fangzhou;CHEN Jian;CAO Shanshan
Format: Artigo
Jezik:Inglês
Izdano: Editorial Board of Atomic Energy Science and Technology 2023-01-01
Serija:Yuanzineng kexue jishu
Teme:
Online dostop:https://www.aest.org.cn/CN/10.7538/yzk.2022.youxian.0162
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