Texture Representation Through Overlapped Multi-Oriented Tri-Scale Local Binary Pattern

This paper ideates a novel texture descriptor that retains its classification accuracy under varying conditions of image orientation, scale, and illumination. The proposed Overlapped Multi-oriented Tri-scale Local Binary Pattern (OMTLBP) texture descriptor also remains insensitive to additive white...

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Hlavní autoři:	Fawad, Muhammad Jamil Khan, Muhammad Ali Riaz, Humayun Shahid, Mansoor Shaukat Khan, Yasar Amin, Jonathan Loo, Hannu Tenhunen
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	IEEE 2019-01-01
Edice:	IEEE Access
Témata:	Classification geometric transformations photometric variations texture representation wavelet decomposition
On-line přístup:	https://ieeexplore.ieee.org/document/8718594/
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