Determination of layer morphology of rough layers in organic light emitting diodes by X‐ray reflectivity
Abstract X‐ray reflectivity (XRR) has been proven to be a useful tool to investigate thin layers as well as buried interfaces in stacks built of very thin layers. Nevertheless, x‐ray reflectivity measurements are limited by the roughness of the layers and interfaces as the roughness destroys the int...
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| Auteurs principaux: | , , , |
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| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
Wiley
2023-04-01
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| Collection: | Engineering Reports |
| Sujets: | |
| Accès en ligne: | https://doi.org/10.1002/eng2.12594 |
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