Comparative Model Efficiency Analysis Based on Dissimilar Algorithms for Image Learning and Correction as a Means of Fault-Finding

The introduction of technology in different sectors to optimise efficiency is increasing rapidly. As a result of the opportunities that artificial intelligence presents to different sectors by optimally performing tasks with less error compared to humans or traditional models, the use of AI in artef...

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Principais autores:	Joe Benganga, Tshepo Kukuni, Ben Kotze, Lepekola Lenkoe
Formato:	Artigo
Idioma:	Inglês
Publicado em:	MDPI AG 2025-05-01
Colecção:	Mathematics
Assuntos:	artefact CT scanner metal artefact ring artefact machine learning image learning
Acesso em linha:	https://www.mdpi.com/2227-7390/13/11/1835
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