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Long-Read–Based de novo Genome Assembly and Comparative Genomics of the Wheat Leaf Rust Pathogen Puccinia triticina Identifies Candidates for Three Avirulence Genes

Leaf rust, caused by Puccinia triticina (Pt), is one of the most devastating diseases of wheat, affecting production in nearly all wheat-growing regions worldwide. Despite its economic importance, genomic resources for Pt are very limited. In the present study, we have used long-read sequencing (LRS...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Egile Nagusiak: Jing Qin Wu, Chongmei Dong, Long Song, Robert F. Park
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: Frontiers Media S.A. 2020-06-01
Saila:Frontiers in Genetics
Gaiak:
Sarrera elektronikoa:https://www.frontiersin.org/article/10.3389/fgene.2020.00521/full
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