Development of Residual Dense U-Net (RDU-Net)-Based Metal Artefacts Reduction Technique Using Spectral Photon Counting CT

Metal induced artefacts in computed tomography (CT) images are primarily caused by beam hardening, scatter effects, and photon starvation. These artefacts impede the characterization of fine anatomical structures and compromise the diagnostic value of the CT images. We aim to develop an innovative m...

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Principais autores:	Osama Khan, Briya Tariq, Nadine Francis, Nabil Maalej, Abderaouf Behouch, Amer Kashif, Asim Waris, Aamir Raja
פורמט:	Artigo
שפה:	Inglês
יצא לאור:	IEEE 2024-01-01
סדרה:	IEEE Access
נושאים:	Computed tomography (CT) metal artefacts reduction (MAR) spectral photon-counting CT (SPCCT)
גישה מקוונת:	https://ieeexplore.ieee.org/document/10630472/
תגים:	הוספת תג אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!