Raman spectroscopy of optical properties in CdS thin films
Properties of CdS thin films were investigated applying atomic force microscopy (AFM) and Raman spectroscopy. CdS thin films were prepared by using thermal evaporation technique under base pressure 2 x 10-5 torr. The quality of these films was investigated by AFM spectroscopy. We apply Rama...
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| Hlavní autoři: | , , , , , , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
International Institute for the Science of Sintering, Beograd
2015-01-01
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| Edice: | Science of Sintering |
| Témata: | |
| On-line přístup: | http://www.doiserbia.nb.rs/img/doi/0350-820X/2015/0350-820X1502145T.pdf |
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