Comparison of gamma ray effects on EPROMs and E2PROMs
This paper compares the reliability of standard commercial Erasable Programmable Read Only Memory (EPROM) and Electrically Erasable Programmable Read Only Memory (E2PROM) components exposed to gamma rays. The results obtained for CMOS-based EPROM (NM27C010) and E2PROM (NM93CS46) components provide t...
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| Hoofdauteurs: | , , |
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| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
VINCA Institute of Nuclear Sciences
2009-01-01
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| Reeks: | Nuclear Technology and Radiation Protection |
| Onderwerpen: | |
| Online toegang: | http://www.doiserbia.nb.rs/img/doi/1451-3994/2009/1451-39940901061V.pdf |
| Tags: |
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