Impact of Annealing on Perpendicular Magnetic Anisotropy and Interfacial Diffusion in Ultrathin [CoFeB/Pd]×n Multilayer Film

The multilayers of Ta/Pd/[CoFeB (0.3 nm)/Pd]×5/Pd films were fabricated by ultra-high-vacuum (UHV) magnetron sputtering and subsequently annealed at temperatures (T_A) ranging from 100 °C to 400 °C. The magnetic measurements were performed with the applied field oriented parallel and perpe...

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Autors principals:	Lakshmanan Saravanan, Murugesan Praveen Kumar, Ayyanuservai Ravikumar, Govindhasamy Murugadoss, Roberto Rodríguez-Suárez, Smiljan Vojkovic, Delhibabu Prabhu, Shaik Gouse Peera, Carlos Garcia
Format:	Artigo
Idioma:	Inglês
Publicat:	MDPI AG 2026-05-01
Col·lecció:	Nanomaterials
Matèries:	spintronics magnetic thin films and multilayers out-of-plane magnetic anisotropy interfacial migration anisotropic magnetoresistance magnetoresonance
Accés en línia:	https://www.mdpi.com/2079-4991/16/9/558
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