Growth model and structure evolution of Ag layers deposited on Ge films
We investigated the crystallinity and optical parameters of silver layers of 10–35 nm thickness as a function 2–10 nm thick Ge wetting films deposited on SiO2 substrates. X-ray reflectometry (XRR) and X-ray diffraction (XRD) measurements proved that segregation of germanium into the surface of the s...
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| Główni autorzy: | , , , , |
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| Format: | Artigo |
| Język: | Inglês |
| Wydane: |
Beilstein-Institut
2018-01-01
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| Seria: | Beilstein Journal of Nanotechnology |
| Hasła przedmiotowe: | |
| Dostęp online: | https://doi.org/10.3762/bjnano.9.9 |
| Etykiety: |
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