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Gate reflectometry of single-electron box arrays using calibrated low temperature matching networks

Abstract Sensitive dispersive readouts of single-electron devices (“gate reflectometry”) rely on one-port radio-frequency (RF) reflectometry to read out the state of the sensor. A standard practice in reflectometry measurements is to design an impedance transformer to match the impedance of the load...

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Bibliografische gegevens
Hoofdauteurs: Matthew J. Filmer, Matthew Huebner, Thomas A. Zirkle, Xavier Jehl, Marc Sanquer, Jonathan D. Chisum, Alexei O. Orlov, Gregory L. Snider
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: Nature Portfolio 2022-02-01
Reeks:Scientific Reports
Online toegang:https://doi.org/10.1038/s41598-022-06727-1
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