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Rapid identification and characterization of genetic loci for defective kernel in bread wheat

Abstract Background Wheat is a momentous crop and feeds billions of people in the world. The improvement of wheat yield is very important to ensure world food security. Normal development of grain is the essential guarantee for wheat yield formation. The genetic study of grain phenotype and identifi...

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Autors principals: Chao Fu, Jiuyuan Du, Xiuling Tian, Zhonghu He, Luping Fu, Yue Wang, Dengan Xu, Xiaoting Xu, Xianchun Xia, Yan Zhang, Shuanghe Cao
Format: Artigo
Idioma:Inglês
Publicat: BMC 2019-11-01
Col·lecció:BMC Plant Biology
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Accés en línia:http://link.springer.com/article/10.1186/s12870-019-2102-6
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