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Genome-wide association study of Northern corn leaf blight (NCLB) resistance using temperate and subtropical maize recombinant inbred lines

Abstract Background Northern corn leaf blight (NCLB) is a foliar disease in maize caused by the fungus Setosphaeria turcica, which severely impacts maize production. Genetic studies can help mitigate the effects of NCLB by developing maize resistant varieties and enhancing overall crop yield. Result...

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Hlavní autoři: Xiaodong Gong, Fuyan Jiang, Ranjan K. Shaw, Jiachen Sun, Tao Dai, Yaqi Bi, Yanhui Pan, Jiao Kong, Haiyang Zong, Xiaoping Yang, Babar Ijaz, Xingming Fan
Médium: Artigo
Jazyk:Inglês
Vydáno: BMC 2025-07-01
Edice:BMC Genomics
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On-line přístup:https://doi.org/10.1186/s12864-025-11806-4
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