The effect of the dielectric end groups on the positive bias stress stability of N2200 organic field effect transistors

Bias stress degradation in conjugated polymer field effect transistors is a fundamental problem in disordered materials and can be traced back to interactions of the material with environmental species [H. Sirringhaus, Adv. Mater. 21, 3859–3873 (2009); S. Park et al., Adv. Funct. Mater. 30 1904590-1...

Ful tanımlama

Kaydedildi:

Detaylı Bibliyografya
Asıl Yazarlar:	D. Simatos, L. J. Spalek, U. Kraft, M. Nikolka, X. Jiao, C. R. McNeill, D. Venkateshvaran, H. Sirringhaus
Materyal Türü:	Artigo
Dil:	Inglês
Baskı/Yayın Bilgisi:	AIP Publishing LLC 2021-04-01
Seri Bilgileri:	APL Materials
Online Erişim:	http://dx.doi.org/10.1063/5.0044785
Etiketler:	Etiketle Etiket eklenmemiş, İlk siz ekleyin!

The effect of the dielectric end groups on the positive bias stress stability of N2200 organic field effect transistors

Benzer Materyaller