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A sub-100 nm thickness flat jet for extreme ultraviolet to soft X-ray absorption spectroscopy

Experimental characterization of the structural, electronic and dynamic properties of dilute systems in aqueous solvents, such as nanoparticles, molecules and proteins, are nowadays an open challenge. X-ray absorption spectroscopy (XAS) is probably one of the most established approaches to this aim...

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Автори: Dario De Angelis, Luca Longetti, Gabriele Bonano, Jacopo Stefano Pelli Cresi, Laura Foglia, Matteo Pancaldi, Flavio Capotondi, Emanuele Pedersoli, Filippo Bencivenga, Marija Krstulovic, Ralf Hendrik Menk, Sergio D'Addato, Stefano Orlando, Monica de Simone, Rebecca A. Ingle, Davide Bleiner, Marcello Coreno, Emiliano Principi, Majed Chergui, Claudio Masciovecchio, Riccardo Mincigrucci
Формат: Artigo
Мова:Inglês
Опубліковано: International Union of Crystallography 2024-05-01
Серія:Journal of Synchrotron Radiation
Предмети:
liquid flat jets
elettra synchrotron
fermi free-electron laser
extreme ultra-violet
high-vacuum environments
x-ray absorption spectroscopy
Онлайн доступ:http://scripts.iucr.org/cgi-bin/paper?S1600577524001875
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