Semantic Feature Learning via Dual Sequences for Defect Prediction
Software defect prediction (SDP) can help developers reasonably allocate limited resources for locating bugs and prioritizing their testing efforts. Existing methods often serialize an Abstract Syntax Tree (AST) obtained from the program source code into a token sequence, which is then inputted into...
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| Autores principales: | , |
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| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
IEEE
2021-01-01
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| Colección: | IEEE Access |
| Materias: | |
| Acceso en línea: | https://ieeexplore.ieee.org/document/9326378/ |
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