A temperature-induced hysteretic behavior of resistivity and magnetoresistance of electrodeposited bismuth microbridges for X-ray transition-edge sensor absorbers

Abstract This study investigates the temperature-induced hysteretic behavior of resistivity and magnetoresistance in electrodeposited bismuth films, with a focus on their application as absorbers in transition-edge sensors (TESs) for X-ray detection. Through a series of resistivity versus temperatur...

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Hlavní autoři:	Orlando Quaranta, Nunzia Coppola, Lisa Gades, Alice Galdi, Tejas Guruswamy, Ludovico Montella, Alessandro Mauro, Luigi Maritato, Antonino Miceli, Sergio Pagano, Carlo Barone
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	Nature Portfolio 2025-11-01
Edice:	Scientific Reports
On-line přístup:	https://doi.org/10.1038/s41598-025-27049-y
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