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Spin-ARPES EUV Beamline for Ultrafast Materials Research and Development

A new femtosecond, Extreme Ultraviolet (EUV), Time Resolved Spin-Angle Resolved Photo-Emission Spectroscopy (TR-Spin-ARPES) beamline was developed for ultrafast materials research and development. This 50-fs laser-driven, table-top beamline is an integral part of the “Ultrafast Spintronic Materials...

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Hlavní autoři: Zhonghui Nie, Ion Cristian Edmond Turcu, Yao Li, Xiaoqian Zhang, Liang He, Jian Tu, Zhiqiang Ni, Huangfeng Xu, Yequan Chen, Xuezhong Ruan, Fabio Frassetto, Paolo Miotti, Nicola Fabris, Luca Poletto, Jing Wu, Qiangsheng Lu, Chang Liu, Thorsten Kampen, Ya Zhai, Wenqing Liu, Cephise Cacho, Xuefeng Wang, Fengqiu Wang, Yi Shi, Rong Zhang, Yongbing Xu
Médium: Artigo
Jazyk:Inglês
Vydáno: MDPI AG 2019-01-01
Edice:Applied Sciences
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On-line přístup:https://www.mdpi.com/2076-3417/9/3/370
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