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Accelerating test, validation and debug of high speed serial interfaces
High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive in...
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| Autors principals: | , |
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| Format: | Livro |
| Idioma: | Inglês |
| Publicat: |
Springer Netherlands,
2011
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| Matèries: | |
| Accés en línia: | https://minerva.ufrj.br/F/?func=direct&doc_number=000909337&local_base=UFR01 |
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