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Introduction to advanced system-on-Chip test design and optimization
Testing concepts - Design flow - Design for test - Boundary scan - SOC design for testability - System modeling - Test conflicts - Test power dissipation - Test access mechanism - Test scheduling - SOC test applications - A reconfigurable power-conscious core wrapper and its application to system-o...
Salvato in:
| Autore principale: | |
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| Natura: | Livro |
| Lingua: | Inglês |
| Pubblicazione: |
Springer,
2005
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| Serie: | Frontiers in electronic testing |
| Soggetti: | |
| Accesso online: | https://minerva.ufrj.br/F/?func=direct&doc_number=000891387&local_base=UFR01 |
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