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Scanning probe microscopy atomic scale engineering by forces and currents /
Scanning probe microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives...
Tallennettuna:
| Päätekijät: | , |
|---|---|
| Aineistotyyppi: | Livro |
| Kieli: | Inglês |
| Julkaistu: |
Springer New York,
2006.
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| Sarja: | Nanoscience and technology |
| Aiheet: | |
| Linkit: | https://minerva.ufrj.br/F/?func=direct&doc_number=000807621&local_base=UFR01 |
| Tagit: |
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