Electrical isolation of dislocations in Ge layers on Si(001) substrates through CMOS-compatible suspended structures

Por Shah, Vishal Ajit, Myronov, Maksym, Wongwanitwatana, Chalermwat, Bawden, Lewis, Prest, Martin J, Richardson-Bullock, James S, Rhead, Stephen, Parker, Evan H C, Whall, Terrance E, Leadley, David R
Publicado no Sci Technol Adv Mater (2012)