Characterization of a self-calibrating, high-precision, stacked-stage, vertical dual-axis goniometer

door Mendenhall, Marcus H., Henins, Albert, Windover, Donald, Cline, James P.
Gepubliceerd in Metrologia (2016)

Advancing X-ray scattering metrology using inverse genetic algorithms

door Hannon, Adam F., Sunday, Daniel F., Windover, Donald, Kline, R. Joseph
Gepubliceerd in J Micro Nanolithogr MEMS MOEMS (2016)

The Optics and Alignment of the Divergent Beam Laboratory X-ray Powder Diffractometer and its Calibration Using NIST Standard Reference Materials

door Cline, James P., Mendenhall, Marcus H., Black, David, Windover, Donald, Henins, Albert
Gepubliceerd in J Res Natl Inst Stand Technol (2015)

High-precision measurement of the X-ray Cu Kα spectrum

door Mendenhall, Marcus H., Henins, Albert, Hudson, Lawrence T., Szabo, Csilla I., Windover, Donald, Cline, James P.
Gepubliceerd in J Phys B At Mol Opt Phys (2017)