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Por Viswanathan, M, Ammerman, A, Eng, E, Garlehner, G, Lohr, K N, Griffith, D, Rhodes, S, Samuel-Hodge, C, Maty, S, Lux, L, Webb, L, Sutton, S F, Swinson, T, Jackman, A, Whitener, L
Publicado no Evid Rep Technol Assess (Summ) (2004)
Obter o texto integralPublicado no Evid Rep Technol Assess (Summ) (2004)
Obter o texto integral
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