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Por Ford, J G, Howerton, M W, Bolen, S, Gary, T L, Lai, G Y, Tilburt, J, Gibbons, M C, Baffi, C, Wilson, R F, Feuerstein, C J, Tanpitukpongse, P, Powe, N R, Bass, E B
Publicado no Evid Rep Technol Assess (Summ) (2005)
Obter o texto integralPublicado no Evid Rep Technol Assess (Summ) (2005)
Obter o texto integral
Artigo