A look underneath the SiO(2)/4H-SiC interface after N(2)O thermal treatments

מאת Fiorenza, Patrick, Giannazzo, Filippo, Swanson, Lukas K, Frazzetto, Alessia, Lorenti, Simona, Alessandrino, Mario S, Roccaforte, Fabrizio
יצא לאור 2013