Probing spatial heterogeneity in silicon thin films by Raman spectroscopy

بواسطة Yamazaki, Hideyuki, Koike, Mitsuo, Saitoh, Masumi, Tomita, Mitsuhiro, Yokogawa, Ryo, Sawamoto, Naomi, Tomita, Motohiro, Kosemura, Daisuke, Ogura, Atsushi
الحاوية / القاعدة Sci Rep (2017)