Determination of recombination lifetime in MOS structures using a lineal voltage-sweep technique

por P. Peykov, T. Diaz, M. Aceves
Publicado no Superficies y vacío (2004)

Rare SHANK2 variants in schizophrenia

por Peykov, S, Berkel, S, Degenhardt, F, Rietschel, M, Nöthen, M M, Rappold, G A
Publicado no Mol Psychiatry (2015)

Identification and functional characterization of rare SHANK2 variants in schizophrenia

por Peykov, S, Berkel, S, Schoen, M, Weiss, K, Degenhardt, F, Strohmaier, J, Weiss, B, Proepper, C, Schratt, G, Nöthen, M M, Boeckers, T M, Rietschel, M, Rappold, G A
Publicado no Mol Psychiatry (2015)