STUDY OF THE INFLUENCE OF THE MEASURING SIGNAL FREQUENCY ON THE INDIRECT MEASUREMENT ERROR OF OXIDE COATINGS PROPERTIES

Por P.E. Golubkov, Е.А. Pecherskaya, G.V. Kozlov, V.S. Alexandrov, О.А. Melnikov, Т.О. Zinchenko
Publicado em 2022-04-01

METROLOGICAL ANALYSIS OF THE CHANNEL FOR MEASURING THE IMPEDANCE OF A GALVANIC CELL IN THE PROCESS MICRO-ARC OXIDATION

Por P.E. Golubkov, E.A. Pecherskaya, O.V. Karpanin, Yu.A. Varenik, V.S. Aleksandrov, G.V. Kozlov
Publicado em 2022-01-01

Features of recombination radiation temperature reduction in semiconductor quantum dots with extrinsic complexes

Por V.D. Krevchik, A.V. Razumov, M.B. Semenov, E.A. Pecherskaya, I.M. Moyko, P.E. Golubkov
Publicado em 2022-01-01

METROLOGICAL TESTS OF A MICRO-ARC OXIDATION GALVANIC CELL IMPEDANCE

Por P.E. Golubkov, E.A. Pecherskaya, O.A. Mel'nikov, O.V. Karpanin, V.S. Aleksandrov, Yu.A. Varenik
Publicado em 2022-01-01