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Por Moher, D, Schachter, H M, Mamaladze, V, Lewin, G, Paszat, L, Verma, S, DeGrasse, C, Graham, I, Brouwers, M, Sampson, M, Morrison, A, Zhang, L, O'Blenis, P, Garrity, C
Publicado no Evid Rep Technol Assess (Summ) (2004)
Obter o texto integralPublicado no Evid Rep Technol Assess (Summ) (2004)
Obter o texto integral
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