Automated Defect and Correlation Length Analysis of Block Copolymer Thin Film Nanopatterns

Yazar: Murphy, Jeffrey N., Harris, Kenneth D., Buriak, Jillian M.
Yayımlandı PLoS One (2015)

Surface Micropatterning of Uniaxially Oriented Polyethylene Films Using Interference Holography for Strain Sensors

Yazar: Shen, Lihua, Lafleur, Sarah S. D., Houben, Simon J. A., Murphy, Jeffrey N., Severn, John R., Bastiaansen, Cees W. M.
Yayımlandı Langmuir (2017)