Automated Defect and Correlation Length Analysis of Block Copolymer Thin Film Nanopatterns

Por Murphy, Jeffrey N., Harris, Kenneth D., Buriak, Jillian M.
Publicado no PLoS One (2015)

Surface Micropatterning of Uniaxially Oriented Polyethylene Films Using Interference Holography for Strain Sensors

Por Shen, Lihua, Lafleur, Sarah S. D., Houben, Simon J. A., Murphy, Jeffrey N., Severn, John R., Bastiaansen, Cees W. M.
Publicado no Langmuir (2017)