Automated Defect and Correlation Length Analysis of Block Copolymer Thin Film Nanopatterns

द्वारा Murphy, Jeffrey N., Harris, Kenneth D., Buriak, Jillian M.
में प्रकाशित PLoS One (2015)

Surface Micropatterning of Uniaxially Oriented Polyethylene Films Using Interference Holography for Strain Sensors

द्वारा Shen, Lihua, Lafleur, Sarah S. D., Houben, Simon J. A., Murphy, Jeffrey N., Severn, John R., Bastiaansen, Cees W. M.
में प्रकाशित Langmuir (2017)